Imaging Defects and Junctions in Single-Walled Carbon Nanotubes by Voltage-Contrast Scanning Electron Microscopy
Carbon; 2010; 48(2) pp. 494–500
On the web: DOI: 10.1016/j.carbon.2009.09.067
Dr. Aravind Vijayaraghavan's Nanofunctional Materials Group |
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