Thurs, Sept 15th, 3:25 PM
|Dr. Aravind Vijayaraghavan's Nanofunctional Materials Group||
Talk: Large-scale, Bottom-up, CMOS-compatible Integration of Chirality-sorted Carbon Nanotubes. B2.7/Y2.7, Mon. Nov 29th, 4:30 - 4:45 PM
Talk:Voltage-contrast Scanning Electron Microscopy as a New Technique for Statistical Analysis of Metallic and Semiconducting SWNT Devices and Location and Characterization of Defects. B4.3, Tues. Nov 30th, 2:00 - 2:15 PM
Talk: Voltage-contrast scanning electron microscopy as a new technique for statistical analysis of SWNT devices and location and characterization of defects.
MSIN satellite session, Sunday, June 27th, 14:40 - 15:00
Poster: Large-scale CMOS compatible integration of chirality sorted carbon nanotubes
Session 4, Thursday, July 1st, 10:00 - 11:30